Atomic Force Microscopy Modified for Studying Electric Properties of Thin Films and Crystals. Review

K. L. Sorokina; A. L. Tolstikhina

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Atomic Force Microscopy Modified for Studying Electric Properties of Thin Films and Crystals. Review

机译：修改原子力显微镜，以研究薄膜和晶体的电性能。评论

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Probe force microscopy continues growing in popularity as a method for studying surfaces of solids and control over crystals and thin films that are grown on various scientific and industrial setups. New modifications of the method increase the possibilities for recording various characteristics of the objects studied. An important role here is played by "electrical" force microscopy, the various modifications and practical applications of which are considered below, as well as the results obtained by this method.

机译：探针力显微镜作为一种研究固体表面并控制在各种科学和工业装置上生长的晶体和薄膜的方法，在人们中的应用正日益普及。该方法的新修改增加了记录所研究对象的各种特征的可能性。在此，“电动”力显微镜起着重要作用，下面将介绍其各种修改形式和实际应用以及通过该方法获得的结果。

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《Crystallography reports》 |2004年第3期|共24页
作者
K. L. Sorokina; A. L. Tolstikhina;
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正文语种 eng
中图分类晶体学;
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1. Atomic Force Microscopy Modified for Studying Electric Properties of Thin Films and Crystals. Review [J] . K. L. Sorokina, A. L. Tolstikhina Crystallography reports . 2004,第3期

机译：修改原子力显微镜，以研究薄膜和晶体的电性能。评论
2. Atomic force microscopy with a conducting tip: correlation studies between microstructure and electrical properties of YBaCuO thin films [J] . Degardin AF., Houze F., Caristan E., Physica, C. Superconductivity and its applications . 2000,第Pta3期

机译：带有导电尖端的原子力显微镜：YBaCuO薄膜的微观结构与电性能之间的相关性研究
3. Study of the Electrical Properties of Cu2ZnSnS4 (CZTS) Thin Film Using Atomic Force Microscopy (AFM) Techniques [J] . Nadarajah Muhunthan, Singh Om Pal, Gour Kuldeep Singh, Journal of nanoscience and nanotechnology . 2020,第6期

机译：用原子力显微镜（AFM）技术研究Cu2ZNSS4（CZTS）薄膜的电性能
4. Local Electrical Properties of Non-Doped Polycrystalline Silicon Thin-Films Evaluated Using Conductive Atomic Force Microscopy [C] . Yoichiro Aya, Atsushi Ando, Satoshi Yamasaki, International semiconductors conference . 2003

机译：使用导电原子力显微镜评估非掺杂多晶硅薄膜的局部电性能
5. Developing alternating current scanning tunneling microscopy and atomic force microscopy to measure thin film properties on the nanoscale. [D] . Szuchmacher, Amy L. 2000

机译：发展交流电扫描隧道显微镜和原子力显微镜以测量纳米级的薄膜特性。
6. Influence of Oxygen Pressure on the Domain Dynamics and Local Electrical Properties of BiFe0.95Mn0.05O3 Thin Films Studied by Piezoresponse Force Microscopy and Conductive Atomic Force Microscopy [O] . Kunyu Zhao, Huizhu Yu, Jian Zou, 2017

机译：氧响应对BiFe0.95Mn0.05O3薄膜的畴动态和局部电学特性的压电响应力显微镜和导电原子力显微镜研究
7. Influence of Oxygen Pressure on the Domain Dynamics and Local Electrical Properties of BiFe0.95Mn0.05O3 Thin Films Studied by Piezoresponse Force Microscopy and Conductive Atomic Force Microscopy [O] . Kunyu Zhao, Huizhu Yu, Jian Zou, 2017

机译：氧压对BiFe0.95mn0.05O3薄膜的畴动力学和局域电学性质的影响研究piezoresponse力显微镜和导电原子力显微镜
8. Scanning Tunneling and Atomic Force Microscopy Studies of Organic Thin Films,Synthetic Polymers and Lignocellulosics [R] . Niemi, H. 1997

机译：有机薄膜，合成聚合物和木质纤维素的扫描隧道和原子力显微镜研究

Atomic Force Microscopy Modified for Studying Electric Properties of Thin Films and Crystals. Review

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