Peculiar reflections in diffraction patterns as indicators of structural type and quality

Kyazumov M. G.

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Peculiar reflections in diffraction patterns as indicators of structural type and quality

机译：衍射图样中的奇特反射反映了结构类型和质量

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Reflections serving as indicators of the types of packets forming crystal structures of many layered semiconductors have been revealed in diffraction patterns. It is found that the values l for the strongest reflection in series 000l and 00l, as well as the next to the strongest reflection in series (h = const) and 0kl (k = const) for hexagonal and monoclinic structures, respectively, determine the number of polyhedral (Tand O) cation-filled layers per cell and indicate the types of packets TOT , , , , and OOE , where T and are inversely oriented tetrahedra, O is an octahedron, E is an empty interpacket layer, and E-1 and E-2 are partially filled (to less than 1/3) interpacket layers.

机译：在衍射图案中已经揭示出反射，该反射充当形成许多层状半导体的晶体结构的包的类型的指示。发现对于六角形和单斜晶结构，在000l和00l系列中最强反射的值l以及在系列中最强反射（h = const）和0kl（k = const）的下一个值分别确定每个单元中多面体（Tand O）阳离子填充层的数量，并指示数据包TOT，，，和OOE的类型，其中T和为反向四面体，O为八面体，E为空包层，E- 1和E-2被部分填充（小于1/3）数据包间层。

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《Crystallography reports》 |2014年第5期|共8页
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Kyazumov M. G.;
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正文语种 eng
中图分类晶体学;
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1. Peculiar reflections in diffraction patterns as indicators of structural type and quality [J] . Kyazumov M. G. Crystallography reports . 2014,第5期

机译：衍射图样中的奇特反射反映了结构类型和质量
2. Origin of peculiar inerratic diffraction patterns recorded by charge-coupled device cameras [J] . Kuanhong XU, Xiaonong ZHU, Peng HUANG, Frontiers of optoelectronics . 2019,第2期

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3. Origin of peculiar inerratic diffraction patterns recorded by charge-coupled device cameras [J] . Kuanhong XU1, Xiaonong ZHU1, Peng HUANG1, 中国光电子学前沿：英文版 . 2019,第002期

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Peculiar reflections in diffraction patterns as indicators of structural type and quality

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