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首页> 外文期刊>Philosophical Magazine Letters >Reversible phase transition in vanadium oxide films sputtered on metal substrates
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Reversible phase transition in vanadium oxide films sputtered on metal substrates

机译:在金属基材上溅射氧化钒膜中的可逆相转变

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摘要

Vanadium oxide films, deposited on aluminium (Al), titanium (Ti) and tantalum (Ta) metal substrates by pulsed RF magnetron sputtering at a working pressure of 1.5x10(-2)mbar at room temperature are found to display mixed crystalline vanadium oxide phases viz., VO2, V2O3, V2O5. The films have been characterized by field-emission scanning electron microscopy, X-ray diffraction, differential scanning calorimetry (DSC) and X-ray photoelectron spectroscopy, and their thermo-optical and electrical properties have been investigated. Studies of the deposited films by DSC have revealed a reversible-phase transition found in the temperature range of 45-49 degrees C.
机译:发现在室温下在1.5×10(-2)毫巴的脉冲RF磁控管溅射铝(Al),钛(Ti),钽(Ta)金属基板上的氧化钒膜在室温下溅射显示混合结晶氧化钒 阶段,VO2,V2O3,V2O5。 薄膜的特征在于现场排放扫描电子显微镜,X射线衍射,差示扫描量热法(DSC)和X射线光电子能谱,并研究了它们的热光和电性能。 DSC的沉积膜的研究表明,在45-49℃的温度范围内发现可逆相转变。

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