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首页> 外文期刊>Journal of biomedical materials research. Part B, Applied biomaterials. >Assessing near infrared optical properties of ceramic orthodontic brackets using cross-polarization optical coherence tomography
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Assessing near infrared optical properties of ceramic orthodontic brackets using cross-polarization optical coherence tomography

机译：使用交叉极化光学相干断层扫描评估陶瓷正畸括号的近红外光学性能

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摘要

Secondary decay (caries) under ceramic orthodontic brackets remains a significant dental problem and near infrared cross-polarization optical coherence tomography (CP-OCT) has the potential to detect underlying demineralization. The purpose of this study was to determine the effect of crystalline structure and chemical composition of ceramic brackets on CP-OCT imaging. Four ceramic brackets types, which were divided into monocrystalline and polycrystalline, were examined using CP-OCT. The results of this study demonstrated that the crys-tallinity of the ceramic brackets affected the 1310 nm CP-OCT imaging with the greatest attenuation seen in polycrystalline alumina brackets. The alumina polycrystalline bracket materials had significantly higher attenuation and scattering than alumina monocrystalline brackets (p<0.05, ANOVA, Bonferroni). Additionally, bracket base morphology and composition affected NIR light attenuation. There was considerable attenuation in bracket bases that contained additive zirconium spheres (approx30 mum) and this alteration was significantly greater than the jagged alumina crystallographic alterations found in the other bracket systems (p<0.05, ANOVA, Bonferroni). Noninvasive, near infrared (NIR) cross-polarization optical coherence tomography (CP-OCT) has potential to effectively image through portions of ceramic brackets; however, further investigation into the optical effects of resin integration in the base portion of the brackets is warranted.
机译：陶瓷正畸括号下的二次衰减（龋齿）仍然是一个显着的牙齿问题，近红外线交叉极化光学相干断层扫描（CP-OCT）具有潜力检测潜在的脱矿质化。本研究的目的是确定陶瓷括号的晶体结构和化学成分对CP-OCT成像的影响。使用CP-OCT检查四种陶瓷支架类型，其分为单晶和多晶硅。本研究的结果表明，陶瓷支架的裂缝 - 高度影响了1310nm CP-OCT成像，在多晶硅氧化铝支架中看到的最大衰减。氧化铝多晶支架材料的衰减和散射显着高于氧化铝单晶支架（P <0.05，ANOVA，Bonferroni）。此外，支架基础形态和组成影响NIR光衰减。在含有添加剂锆球（大约30毫米）的支架碱中存在相当大的衰减，并且这种改变显着大于其他支架系统中发现的锯齿状氧化铝晶体改变（P <0.05，Anova，Bonferroni）。非侵入性，近红外（NIR）交叉偏振光光学相干断层扫描（CP-OCT）具有通过部分陶瓷支架的有效图像;然而，有必要进一步研究括号的基部中树脂积分的光学效应。

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