Nanoscale Optical Microscopy and Spectroscopy Using Near-Field Probes

Hermann Richard J.; Gordon Michael J.

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Nanoscale Optical Microscopy and Spectroscopy Using Near-Field Probes

机译：纳米级光学显微镜和光谱法使用近场探头

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Light-matter interactions can provide a wealth of detailed information about the structural, electronic, optical, and chemical properties of materials through various excitation and scattering processes that occur over different length, energy, and timescales. Unfortunately, the wavelike nature of light limits the achievable spatial resolution for interrogation and imaging of materials to roughly lambda/2 because of diffraction. Scanning near-field optical microscopy (SNOM) breaks this diffraction limit by coupling light to nanostructures that are specifically designed to manipulate, enhance, and/or extract optical signals from very small regions of space. Progress in the SNOM field over the past 30 years has led to the development of many methods to optically characterize materials at lateral spatial resolutions well below 100 nm. Wereview these exciting developments and demonstrate how SNOMis truly extending optical imaging and spectroscopy to the nanoscale.

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《Annual review of chemical and biomolecular engineering》 |2018年第2018期|共23页
作者
Hermann Richard J.; Gordon Michael J.;
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作者单位

Univ Calif Santa Barbara Dept Chem Engn Santa Barbara CA 93106 USA;

Univ Calif Santa Barbara Dept Chem Engn Santa Barbara CA 93106 USA;

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原文格式 PDF
正文语种 eng
中图分类化学工业;
关键词
scanning near-field optical microscopy; nanoscale imaging; diffraction limit; optical spectroscopy; tip-enhanced Raman scattering; TERS; SNOM;

机译：扫描近场光学显微镜;纳米级成像;衍射极限;光谱学;尖端增强拉曼散射;TERS;SNOM;

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机译：具有尖头探针的近场光学显微镜和光谱学

Nanoscale Optical Microscopy and Spectroscopy Using Near-Field Probes

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