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Measurement of (241)Am L X-ray emission probabilities.

机译:(241)Am L X射线发射概率的测量。

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Measurements of (241)Am L X-ray emission probabilities were conducted using both HPGe and Si(Li) detectors. The efficiency calibrations of these detectors were performed by means of a tunable, monochromatic photon beam and the determination of the thickness of absorbing materials inside the detector. These efficiency calibrations were obtained without any reference to radionuclide decay data, and with 0.8% relative standard uncertainty. The complex L X-ray region was processed using Voigt functions and by taking account of the detector response function established with the monochromatic beam. Twenty-two components of the L X-ray group were identified and quantified. The present results are compared with previously published data.
机译:使用HPGe和Si(Li)检测器进行(241)Am L X射线发射概率的测量。这些探测器的效率校准是通过可调的单色光子束和确定探测器内部吸收材料的厚度来进行的。在不参考放射性核素衰变数据且相对标准不确定度为0.8%的情况下获得了这些效率校准。使用Voigt函数并考虑到用单色光束建立的探测器响应函数来处理复杂的L X射线区域。鉴定并定量了L X射线组的22个成分。将当前结果与以前发布的数据进行比较。

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