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首页> 外文期刊>Boletin de la Sociedad Espanola de Ceramica y Vidrio >High frequency and magnetoelectrical properties of magnetoresistive memory element based on FeCoNi/TiN/FeCoNi film
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High frequency and magnetoelectrical properties of magnetoresistive memory element based on FeCoNi/TiN/FeCoNi film

机译:基于FeCoNi / TiN / FeCoNi膜的磁阻存储元件的高频和电磁性能

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摘要

A miniaturised memory device for information recording and readout processes have been designed on the basis of anisotro-pic magnetoresistive effect in Fel5Co2ONi65(160A)/ TiN(50A)/Fel5Co2ONi65(160A) three4ayered film done by rf diode sput-tering. Stable recording and readout processes were available for 32 rectangular element column, where each element had pm dimensions convenient to fabricate memory chip with 106 bits capacity. Rectangles of different sizes with removed comers were used in order to define the geometry of most of all stable recording and readout processes. Magnetoresistance and mag-netoimpedance effects of a magnetic memory device have been comparatively analysed. We suggest that the decrease of the absolute value of the magnetoimpedance of the memory device comes from the reduction of the real part via the magnetoresistance.
机译:根据射频二极管溅射法在Fel5Co2ONi65(160A)/ TiN(50A)/ Fel5Co2ONi65(160A)三层膜中的各向异性磁阻效应,设计了一种用于信息记录和读出过程的小型存储设备。稳定的记录和读出过程可用于32个矩形元素列,其中每个元素的pm尺寸便于制造106位容量的存储芯片。为了定义所有稳定的记录和读出过程中大多数的几何形状,使用了带有去除角的不同大小的矩形。已经比较分析了磁存储器件的磁阻和磁阻效应。我们建议存储设备的磁阻绝对值的减小是由于通过磁阻导致的实部减小。

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