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Variation on Zernike's phase-contrast microscope

机译：Zernike相衬显微镜的变化

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摘要

We describe the design, construction, and testing of a variant of Zernike's phase-contrast microscope. The sample is illuminated with a white-light source through an annular aperture, which is projected onto the entrance pupil of the objective lens. In the return path the light diffracted by the sample and appearing in the interior of the objective's aperture (i.e., the test beam) is separated from the light returning in the annular region near the rim of the objective (i.e., the reference beam). The separated beams are relatively phase shifted and then combined to create an interferogram of the sample's surface on a CCD camera. It is fairly straightforward to use this system as a conventional bright-field or dark-field microscope, but its most interesting application is as a Zernike phase-contrast microscope with adjustable amplitude ratio and phase shift between test and reference beams. The ability to continuously adjust the phase of the reference beam also enables quantitative measurement of the phase imparted by the sample to the incident beam.
机译：我们描述了Zernike相衬显微镜的变体的设计，构造和测试。样品通过环形孔用白光源照射，该孔被投影到物镜的入射光瞳上。在返回路径中，样品衍射并出现在物镜孔径内部的光（即测试光束）与在物镜边缘附近的环形区域中返回的光（即参考光束）分离。分离的光束相对移相，然后合并以在CCD相机上产生样品表面的干涉图。将该系统用作传统的明场或暗场显微镜非常简单，但它最有趣的应用是作为Zernike相衬显微镜，其振幅比和测试光束与参考光束之间的相移可调。连续调节参考光束相位的能力还使得能够定量测量样品赋予入射光束的相位。

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