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Simple and accurate wavemeter implemented with a polarization interferometer

机译：用偏振干涉仪实现的简单而精确的波表

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摘要

A simple and accurate wavemeter for measuring the wavelength of monochromatic light is described. The device uses the wavelength-dependent phase lag between principal polarization states of a length of birefringent material (retarder) as the basis for the measurement of the optical wavelength. The retarder is sandwiched between a polarizer and a polarizing beam splitter and is oriented such that its principal axes are 45 deg to the axis of the polarizer and the principal axes of the beam splitter. Asa result of the disparity in propagation velocities between the principal polarization states of the retarder, the ratio of the optical power exiting the two ports of the polarizing beam splitter is wavelength dependent. If the input wavelength is known to be within a specified range, the measurement of the power ratio uniquely determines the input wavelength. The device offers the advantage of trading wavelength coverage for increased resolution simply through the choice of the retarder length. Implementations of the device employing both bulk-optic components and fiber-optic components are described, and the results of a laboratory test of a fiber-optic prototype are presented. The prototype had a wavelength accuracy of +/-0.03 nm.
机译：描述了一种用于测量单色光的波长的简单而精确的波表。该设备将一定长度的双折射材料（延迟）的主偏振态之间的波长相关相位滞后作为光波长测量的基础。该延迟器夹在偏振器和偏振分束器之间，并且定向成使得其主轴线与偏振器的轴线和分束器的主轴线成45度角。由于延迟器的主要偏振态之间的传播速度的差异，离开偏振分束器两个端口的光功率比与波长有关。如果已知输入波长在指定范围内，则功率比的测量将唯一确定输入波长。该设备的优势在于，只需选择延迟器的长度，就可以将波长覆盖范围进行权衡以提高分辨率。描述了同时使用大块光学组件和光纤组件的设备的实现，并介绍了光纤原型的实验室测试结果。原型的波长精度为+/- 0.03 nm。

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