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Chemical Etching Phases of Irradiated CR-39 Track Detector by Positron Annihilation Doppler Broadening Spectroscopy

机译:正电子ni没多普勒展宽光谱仪对辐照CR-39径迹探测器的化学蚀刻相

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摘要

Positron annihilation Doppler broadening (DB) spectroscopy is a characterization technique that is sensitive to radiation damage in polymers. Passage of α-particles radiation through the CR-39 polymer detector produces damage or defect. It is convenient to study this defect by Doppler broadening spectroscopy. This study found that the fraction of positrons trapped depends on α-particle energies.
机译:正电子an没多普勒增宽(DB)光谱是一种表征技术,对聚合物中的辐射损伤敏感。 α粒子辐射穿过CR-39聚合物检测器会产生损坏或缺陷。通过多普勒增宽光谱研究该缺陷很方便。这项研究发现,被俘获的正电子比例取决于α粒子的能量。

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