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Treatments of Deposited SiO_x Surfaces Enabling Low Temperature Direct Bonding

机译:低温直接键合沉积的SiO_x表面的处理

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摘要

The effect of several surface treatments such as chemical-mechanical polishing or plasma activation applied to deposited silicon oxide layer surfaces prior to direct bonding has been investigated. It is shown that these treatments have a direct impact on surface and near subsurface OH bond densities which greatly participate in bonding energy changes. Better understanding of mechanism is proposed even if some conditions still deserve more investigation.
机译:已经研究了在直接键合之前对沉积的氧化硅层表面进行化学机械抛光或等离子体活化等几种表面处理的效果。结果表明,这些处理对表面和近表面下的OH键密度具有直接影响,而OH键密度极大地参与了键能的变化。即使某些条件仍然值得进一步研究,也建议对机制有更好的了解。

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