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首页> 外文期刊>Microwave and optical technology letters >FOURTH-ORDER ACCURATE SUB-SAMPLING FOR FINITE-DIFFERENCE ANALYSIS OF SURFACE PLASMON METALLIC WAVEGUIDES
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FOURTH-ORDER ACCURATE SUB-SAMPLING FOR FINITE-DIFFERENCE ANALYSIS OF SURFACE PLASMON METALLIC WAVEGUIDES

机译：表面等离子金属波导有限差分分析的四阶精确子采样

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摘要

Recently, particular attention has been given to metallic waveguides supporting surface plasmons as promising components for integrated optical devices. However, the use of conventional numerical optimization tools for their design is hindered by the intensive computational effort associated with meshing down to the resolution of the thin metallic layer. In this study, the previous three-point second order accurate finite-difference formula suitable for correctly placing thin dielectric layers within coarse grids is extended to fourth order accuracy by using the generalized Douglas scheme, including the case when thin metallic layers supporting surface plasmons lie wholly between sample points. The improved formulation, combined with an imaginary distance procedure, is used to analyze the eigenmodes of both 2D and 3D thin metal films located upon dielectric substrates. Accurate calculation with coarser meshes than those required by the other standard differencing schemes is demonstrated, thus providing both a significant saving in computational resource and an extra degree of freedom in meshing such structures.
机译：近来，已经特别关注了支撑表面等离子体激元的金属波导，作为集成光学设备的有希望的组件。但是，与网格划分直到薄金属层的分辨率相关的大量计算工作阻碍了常规数值优化工具在其设计中的使用。在这项研究中，以前的三点二阶精确有限差分公式适用于在粗网格内正确放置薄介电层，通过使用广义道格拉斯方案将其扩展到四阶精度，包括支撑表面等离激元的薄金属层位于其中的情况完全在采样点之间。改进的公式，结合一个假想的距离程序，用于分析位于介电基片上的2D和3D薄膜的本征模。与其他标准差分方案所需的相比，使用更粗的网格进行了精确的计算得到了证明，从而既节省了计算资源，又为网格划分提供了更大的自由度。

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