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首页> 外文期刊>Measurement Science & Technology >Total reflection of x-ray fluorescence (TXRF): a mature technique for environmental chemical nanoscale metrology
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Total reflection of x-ray fluorescence (TXRF): a mature technique for environmental chemical nanoscale metrology

机译：X射线荧光（TXRF）的全反射：一种用于环境化学纳米级计量的成熟技术

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摘要

Total reflection x-ray fluorescence (TXRF) is a technique well established for chemical analysis of samples deposited as a thin layer. Nowadays it is mainly employed for electronic industry quality control. Recently, very compact and economic TXRF instrumentation was proposed. Combining this with the capability to analyze liquid samples, this technique is suitable to be employed in many different applications, comprising the very critical field of environmental analysis. Comparisons with the standard atomic absorption spectroscopy (AAS) technique show that TXRF is a practical, accurate, and reliable technique. Indeed, round-robin activities have already been started. Despite the efficiency and economy of the developed portable TXRF instrumentation, this is not widely employed for chemical laboratory analysis probably because TXRF is not an officially recognized technique, i.e. it is not yet normative-subjected. This fact could also be due to the long background of analytical applications developed for AAS, ICPS or inductively coupled plasma mass spectroscopy (ICP-MS) up to now. In this paper, we present a work of environmental monitoring of an industrial site, performed by means of bioindicators (lichens). The analysis of trace elements concentration in lichen was usually conducted with spectrophotometric techniques, such as AAS and ICP-MS, which were accepted by common regulations and normative-subjected. In this study, we accomplished a comparative lichen analysis by AAS and TXRF. The reproducibility of the obtained results showed the high correspondence between the two techniques. This comparison highlighted the versatility of the TXRF apparatus that allowed more rapid and simultaneous element detection. The obtained results suggested that this portable TXRF system could be suitable for regulation to produce certificated analysis upto ppb concentrations for some elements.
机译：全反射X射线荧光（TXRF）是一种建立用于薄层样品化学分析的技术。如今，它主要用于电子行业的质量控制。最近，提出了非常紧凑和经济的TXRF仪器。将其与分析液体样品的能力相结合，该技术适用于许多不同的应用，包括非常关键的环境分析领域。与标准原子吸收光谱法（AAS）技术的比较表明，TXRF是一种实用，准确和可靠的技术。实际上，循环活动已经开始。尽管已开发的便携式TXRF仪器具有效率和经济性，但由于TXRF并不是官方认可的技术，即尚未经过标准化处理，因此并未广泛用于化学实验室分析。这一事实也可能归因于迄今为止为AAS，ICPS或电感耦合等离子体质谱（ICP-MS）开发的分析应用的悠久背景。在本文中，我们介绍了通过生物指示剂（地衣）对工业现场进行环境监测的工作。地衣中痕量元素的浓度分析通常采用分光光度法进行，例如AAS和ICP-MS，这些方法已被通用法规接受并遵循规范。在这项研究中，我们通过AAS和TXRF完成了比较地衣分析。所得结果的可重复性表明两种技术之间的高度对应性。这种比较突出了TXRF设备的多功能性，从而可以更快速，同时进行元素检测。获得的结果表明，该便携式TXRF系统可能适合进行调节，以对某些元素进行高达ppb浓度的认证分析。

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