If you work in the imperial (inch) measurement system, reducing the least input increment can help you hold size for workpiece attributes with small tolerances. I have often said that working in the metric measurement system provides a better resolution for sizing (offset) adjustments than the imperial measurement system. My reasoning is based on the size of the least input increment in each measurement system. In metric, the least input increment that can be entered into an offset is typically one micron (0.001 mm). In imperial, it is typically one ten-thousandth of an inch (0.0001 inch). One micron is less than half of one ten-thousandth of an inch (a micron is equivalent to 0.000039 inch), hence the better resolution.
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