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Two-bit ferroelectric field-effect transistor memories assembled on individual nanotubes

机译:组装在单个纳米管上的两位铁电场效应晶体管存储器

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摘要

Carbon nanotube (CNT) ferroelectric field-effect transistors (FeFETs) with well-definedmemory switch behaviors are promising for nonvolatile, nondestructive read-out (NDRO) memory operation and ultralow power consumption. Here, we report two-bit CNT-FeFET memories by assembling two top gates on individual nanotubes coated with ferroelectric thin films. Each bit of the nanotube transistor memory exhibits a controllable memory switching behavior induced by the reversible remnant polarization of the ferroelectric films, and its NDRO operation is demonstrated. The low driving voltage of 2 V, high carrier mobility over 1000 cm2 V-1 s-1, and potential ultrahigh integration density over 200 Gbit inch-2 of the two-bit FeFET memory are highlighted in this paper.
机译:具有明确定义的存储器开关特性的碳纳米管(CNT)铁电场效应晶体管(FeFET)对于非易失性,非破坏性读出(NDRO)存储器操作和超低功耗具有广阔的前景。在这里,我们通过在涂有铁电薄膜的单个纳米管上组装两个顶栅来报告两位CNT-FeFET存储器。纳米管晶体管存储器的每一位都表现出由铁电薄膜的可逆残余极化引起的可控的存储器开关行为,并对其NDRO操作进行了演示。本文重点介绍了2位FeFET存储器的2 V低驱动电压,超过1000 cm2 V-1 s-1的高载流子迁移率以及超过200 Gbit inch-2的潜在超高集成密度。

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