Carbon nanotubes as probed for atomic force microscopy

R. M. D. Stevens; N. A. Frederick

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Carbon nanotubes as probed for atomic force microscopy

机译：碳纳米管探测原子力显微镜

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Tip-derived artifacts remain of the chief limitationsof atomic force microscopy (AFM) when attempting to measuresub-nanometre structures. Carbon nanotubes represent idealstructures for use as AFM tips because of their small diameter,high aspect ratio and high strength. We attached single carbonnanotube AFM tips using a novel arc discharge method. Usingthese modified tips, we successfully imaged a protein filamentfound in sponge spicules of Tethya aurantia. We report a modularstave-like structure for the protein filament that was previouslyunobservable with conventional AFM cantilevers.

机译：当试图测量纳米级结构时，尖端衍生的伪像仍然是原子力显微镜（AFM）的主要局限性。碳纳米管具有直径小，纵横比高，强度高等特点，是用作AFM尖端的理想结构。我们使用一种新颖的电弧放电方法连接了单个碳纳米管AFM吸头。使用这些修饰的笔尖，我们成功地成像了在特提亚ur兰的海绵针中发现的蛋白质丝。我们报告蛋白质丝的模块化梯级状结构，以前传统的AFM悬臂无法观察到。

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《Nanotechnology》 |2000年第1期|共5页
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R. M. D. Stevens; N. A. Frederick;
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正文语种 eng
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1. Unraveling nanoscale conduction and work function in a poly(3,4-ethylenedioxypyrrole)/carbon nanotube composite by Kelvin probe force microscopy and conducting atomic force microscopy [J] . B. Narsimha Reddy, Melepurath Deepa Electrochimica Acta . 2012,第Null期

机译：开尔文探针力显微镜和导电原子力显微镜揭示聚（3,4-乙撑二氧基吡咯）/碳纳米管复合材料中的纳米级导电和功函数
2. THE STRUCTURE OF THE CARBON NANOTUBE AND ITS SURFACE TOPOGRAPHY PROBED BY TRANSMISSION ELECTRON MICROSCOPY AND ATOMIC FORCE MICROSCOPY [J] . Tsang SC., Davis JJ., Green MLH., Chemical Physics Letters . 1996,第5a6期

机译：透射电子显微镜和原子力显微镜探测碳纳米管的结构及其表面层析
3. Influence of the carbon nanotube probe tilt angle on the effective probe stiffness and image quality in tapping-mode atomic force microscopy [J] . Solares SD, Matsuda Y, Goddard WA The journal of physical chemistry, B. Condensed matter, materials, surfaces, interfaces & biophysical . 2005,第35期

机译：敲击模式原子力显微镜中碳纳米管探针倾斜角对有效探针刚度和图像质量的影响
4. Self-assembled Carbon Nanotube-DNA Hybrids at the Nanoscale: Morphological and Conductive Properties Probed by Atomic Force Microscopy [C] . M. Gabriella Santonicola, Susanna Laurenzi, Peter M. Schoen Nanotubes and related nanostructures - 2014 . 2014

机译：纳米尺度的自组装碳纳米管-DNA杂化物：原子力显微镜探测的形态和导电性能。
5. Highly controlled fabrication of carbon nanotube based probes for atomic force microscopy [D] . Chen, I-Chen 2007

机译：高度受控地制造用于原子力显微镜的基于碳纳米管的探针
6. Improved Application of Carbon Nanotube Atomic Force Microscopy Probes Using PeakForce Tapping Mode [O] . Ashley D. Slattery, Cameron J. Shearer, Joseph G. Shapter, 2018

机译：利用PeakForce攻丝模式改进碳纳米管原子力显微镜探针的应用
7. Influence of the Carbon Nanotube Probe Tilt Angle on the Effective Probe Stiffness and Image Quality in Tapping-Mode Atomic Force Microscopy [O] . Solares Santiago D., Matsuda Yuki, Goddard William A. III 2005

机译：碳纳米管探针倾斜角对攻牙型原子力显微镜中有效探针刚度和图像质量的影响

Carbon nanotubes as probed for atomic force microscopy

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