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Electrical modification of a conductive polymer using a scanning probe microscope

机译：使用扫描探针显微镜对导电聚合物进行电改性

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摘要

We have demonstrated the electrical modification of a conductive polymer for data storage using a scanning probe microscope (SPM). A blend of polyaniline and polymethyl-methacrylate as the conductive polymer was spun on a silicon substrate to make a test specimen. The tip of a conductive SPM probe was placed in contact with the conductive polymer and electrical modification was carried out by applying a voltage between the SPM probe and the conductive polymer. The conductance image and a simultaneous topographic image were taken with the SPM. It was found that the electrical conductivity was decreased more than 20 times by this modification. Measurement of the topographic image shows no obvious change to the surface topography in the modified area. Measurement of the I-V characteristics suggests that a chemical reaction occurred at an applied voltage of about 3.2 V.
机译：我们已经证明了使用扫描探针显微镜（SPM）进行数据存储的导电聚合物的电修饰。将聚苯胺和聚甲基丙烯酸甲酯的混合物作为导电聚合物纺丝在硅基板上，制成测试样品。放置导电SPM探针的尖端使其与导电聚合物接触，并通过在SPM探针和导电聚合物之间施加电压进行电改性。用SPM拍摄电导图像和同时的地形图像。发现通过该修改，电导率降低了20倍以上。地形图像的测量显示，修改区域中的表面地形没有明显变化。 I-V特性的测量表明，在约3.2 V的施加电压下发生了化学反应。

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