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首页> 外文期刊>Nanotechnology >Determination of effective tip geometries in Kelvin probe force microscopy on thin insulating films on metals
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Determination of effective tip geometries in Kelvin probe force microscopy on thin insulating films on metals

机译：用开尔文探针力显微镜在金属薄绝缘膜上确定有效的尖端几何形状

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In scanning probe techniques, accurate height measurements on heterogeneous surfaces are a major requirement. Different electrostatic potentials of various materials have a significant influence on the measured force/current and therefore a direct influence on the tip–sample distance. Kelvin probe force microscopy (KPFM) is based on a dynamic compensation of the electrostatic force while performing non-contact atomic force microscopy measurements. Thus, the influence of the electrostatic potentials can be minimized and accurate height measurements become possible. Here, the study of ultra-thin alkali halide films on Cu(111) investigated by KPFM is presented. This work is focused on the interface between areas of bare Cu(111) and the first layers of salt. The compensation of the electrostatic potential allow us to determine layer heights with high accuracy. The second objective was to elaborate on the characterization of tip geometries across suitable nanostructures. Simulations of measured images are performed with different input parameters, which gives a direct estimation of the effective tip radius and geometry used for the measurements.
机译：在扫描探针技术中，在异质表面上进行精确的高度测量是主要要求。各种材料的不同静电势会对测得的力/电流产生重大影响，因此对针尖与样品的距离也有直接影响。开尔文探针力显微镜（KPFM）基于静电力的动态补偿，同时执行非接触式原子力显微镜测量。因此，可以最小化静电势的影响，并且可以进行精确的高度测量。在这里，提出了由KPFM研究Cu（111）上的超薄碱金属卤化物薄膜的研究。这项工作的重点是裸露的Cu（111）和第一层盐之间的界面。静电势的补偿使我们能够高精度确定层高。第二个目标是详细阐述跨合适纳米结构的尖端几何形状的表征。使用不同的输入参数执行对测量图像的模拟，这可以直接估算有效的尖端半径和用于测量的几何形状。

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