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Insitu observations of endotaxial growth of CoSi_2 nanowires on Si(110) using ultrahigh vacuum transmission electron microscopy

机译:使用超高真空透射电子显微镜原位观察Co(SiSi)纳米线在Si(110)上的外延生长

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We report insitu observations of the growth of endotaxial CoSi_2 nanowires on Si(110) using an ultrahigh vacuum transmission electron microscope with a miniature electron-beam deposition system located above the pole-piece of the objective lens. Metal deposition at 750-850 °C results in formation of coherently strained silicide nanowires with a fixed length/width (L/W) aspect ratio that depends strongly on temperature. Both dimensions evolve with time as L, W ~ t~(1/3). To explain this behavior, we propose a fixed-shape growth mode based on thermally activated facet-dependent reactions. A second growth mode is also observed at 850 °C, with dimensions that evolve as L ~ t and W ~ constant. This mode is accompanied by formation of an array of dislocations. We expect that other endotaxial nanowire systems will follow coherently strained growth modes with similar geometrical constraints, as well as dislocated growth modes with different growth kinetics
机译:我们使用超高真空透射电子显微镜和位于物镜极靴上方的微型电子束沉积系统,报告了在Si(110)上内生CoSi_2纳米线生长的原位观察。在750-850°C的温度下进行的金属沉积会导致形成相干应变的硅化物纳米线,其长宽比(L / W)固定不变,这与温度密切相关。两个维度都随着时间的变化而变化,为L,W〜t〜(1/3)。为了解释这种行为,我们提出了一种基于热激活的面相关反应的固定形状的生长模式。在850°C时也观察到第二种生长模式,其尺寸随着L〜t和W〜恒定而变化。这种模式伴随着一系列位错的形成。我们期望其他内轴纳米线系统将遵循具有相似几何约束的相干应变生长模式,以及具有不同生长动力学的错位生长模式

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