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Light emission induced by tunnelling electrons from a p-type GaAs(110) surface observed at near-field by a conductive optical fibre probe

机译:导电光纤探针在近场观察到的通过隧穿电子从p型GaAs(110)表面隧穿引起的发光

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摘要

An ultrahigh-vacuum low-temperature scanning tunnelling microscope with a near-field optical detection system using conductive and optically transparent probes was used to study tunnelling-electron-induced photon emission from a cleaved p-type GaAs(110) surface. Photons generated in a nanometre-scale area just under the probe were collected within the optical near-field region into the core of the optical fibre tip. We observed a strong photon emission at positive sample biases by injecting electrons into the surface, where radiative recombination of electron-hole pairs is a reasonable explanation for the STM-induced photon emission. A drop in photon intensity at the Zn dopant regions was-observed, which can be explained by the local band potential change around the Zn acceptor atoms located at sub-surface layers.
机译:使用具有导电和光学透明探针的近场光学检测系统的超高真空低温扫描隧道显微镜,研究了劈裂的p型GaAs(110)表面的隧道电子诱导的光子发射。在探头正下方的纳米级区域中产生的光子在光学近场区域内收集到光纤尖端的芯中。我们通过将电子注入表面来观察到正样品偏压下的强光子发射,其中电子-空穴对的辐射复合是STM诱导光子发射的合理解释。观察到Zn掺杂剂区域的光子强度下降,这可以通过位于亚表层的Zn受体原子周围的局部带电势变化来解释。

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