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Electrostatic nanopatterning of PMMA by AFM charge writing for directed nano-assembly

机译:通过AFM电荷写入法对PMMA进行静电纳米构图,以进行定向纳米组装

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Electrostatic nanopatterning of poly( methylmethacrylate) ( PMMA) thin films by atomic force microscopy (AFM) charge writing was investigated using Kelvin force microscopy (KFM). The lateral size of the electrostatic patterns and the amount of injected charges are closely correlated and can be controlled by the height of the voltage pulses applied to the AFM tip and the tip-sample separation during the writing process. Charge retention measurements show that PMMA has excellent charge storage properties in air under relative humidities from 1% to 60% and withstands immersion in ultra-pure water. This study thus reveals that PMMA is a very promising electret to create efficient electrostatic nanopatterns for directed self-assembly of nanoscale objects, including the broad range of colloidal particles or molecules in aqueous solutions.
机译:使用开尔文力显微镜(KFM)研究了通过原子力显微镜(AFM)电荷写入对聚甲基丙烯酸甲酯(PMMA)薄膜进行的静电纳米构图。静电图案的横向尺寸和注入的电荷量紧密相关,并且可以通过在写入过程中施加到AFM尖端的电压脉冲的高度和尖端样品的分离来控制。电荷保持力测量表明,PMMA在1%至60%的相对湿度下在空气中具有出色的电荷存储性能,并且可以浸入超纯水中。因此,这项研究表明,PMMA是一种非常有前途的驻极体,它可以产生有效的静电纳米图案,用于纳米物体的定向自组装,包括水溶液中的各种胶体颗粒或分子。

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