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Coalescence and sintering of Pt nanoparticles: in situ observation by aberration-corrected HAADF STEM

机译：铂纳米粒子的聚结和烧结：通过像差校正的HAADF STEM进行原位观察

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摘要

An aberration-corrected JEOL 2200FS scanning-transmission electron microscope (STEM), equipped with a high-angle annular dark-field detector (HAADF), is used to monitor the coalescence and sintering of Pt nanoparticles with an average diameter of 2.8 nm. This in situ STEM capability is combined with an analysis methodology that together allows direct measurements of mass transport phenomena that are important in understanding how particle size influences coalescence and sintering at the nanoscale. To demonstrate the feasibility of this methodology, the surface diffusivity is determined from measurements obtained from STEM images acquired during the initial stages of sintering. The measured surface diffusivities are in reasonable agreement with measurements made on the surface of nanoparticles, using other techniques. In addition, the grain boundary mobility is determined from measurements made during the latter stages of sintering.
机译：配备高角度环形暗场检测器（HAADF）的像差校正JEOL 2200FS扫描透射电子显微镜（STEM）用于监测平均直径为2.8 nm的Pt纳米粒子的聚结和烧结。这种原位STEM功能与分析方法相结合，可以一起直接测量质量传输现象，这对于理解粒径如何影响纳米级的聚结和烧结非常重要。为了证明这种方法的可行性，表面扩散率是根据在烧结初期从STEM图像获得的测量值确定的。使用其他技术，测得的表面扩散率与在纳米颗粒表面上进行的测量合理地吻合。另外，晶界迁移率是根据在烧结后期进行的测量确定的。

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