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GaSb/GaAs quantum dot systems: in situ synchrotron radiation x-ray photoelectron spectroscopy study

机译:GaSb / GaAs量子点系统:原位同步辐射X射线光电子能谱研究

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摘要

GaSb/GaAs quantum dot systems are fabricated using MBE under various growth modes. The as-grown samples are studied with in situ synchrotron radiation XPS covering the As 3d, Sb 4d and Ga 3d core levels and the valence band region. The XPS spectra show dramatic changes with the growth modes, reflecting changes in the local electronic structure and chemical environments of the surface and interface atoms in both quantum dots and wetting layer. A quantum dot specific contribution near the valence band maximum is identified and related to the hole accumulation process. Local valence band offsets measured in the GaSb/GaAs systems evolve over the interface region and depend on the growth modes, which adds another degree of freedom to band engineering on the nanoscale.
机译:GaSb / GaAs量子点系统是使用MBE在各种生长模式下制造的。使用覆盖As 3d,Sb 4d和Ga 3d核心能级和价带区域的原位同步加速器辐射XPS对生长后的样品进行研究。 XPS光谱显示出随着生长模式的巨大变化,反映出量子点和润湿层中表面和界面原子的局部电子结构和化学环境的变化。在价带最大值附近的量子点特定贡献被确定并且与空穴累积过程有关。在GaSb / GaAs系统中测得的局部价带偏移在界面区域上演化并取决于生长模式,这为纳米级的能带工程增加了另一个自由度。

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