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Increase in hypoxanthine-guanine phosphoribosyl transferase gene mutations by exposure to electric field.

机译:暴露于电场下次黄嘌呤-鸟嘌呤磷酸核糖基转移酶基因突变的增加。

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Previously, we reported that exposure to extremely low frequency magnetic field (400 mT) increased in hypoxanthine-guanine phosphoribosyl transferase (HPRT) gene mutations. However, it is unclear these mutations were induced by magnetic field (MF), electric field (EF), or both. To explore this question, a new exposure apparatus for EF was manufactured. We observed an increase in HPRT gene mutations in Chinese hamster ovary (CHO) cells after exposure to EF (10 V/m, 60 Hz) for 10 h. The mutant frequency by EF-exposure was an approximate 2-fold of that by sham-exposure. Our data suggest that the mutations induced by exposure of cells to the variable magnetic field at 400 mT may be, in part, due to the induced EF.
机译:以前,我们报道次黄嘌呤-鸟嘌呤磷酸核糖基转移酶(HPRT)基因突变增加了暴露于极低频磁场(400 mT)的程度。但是,尚不清楚这些突变是由磁场(MF),电场(EF)或两者引起的。为了探讨这个问题,制造了一种新的EF曝光设备。我们观察到暴露于EF(10 V / m,60 Hz)10 h后,中国仓鼠卵巢(CHO)细胞中HPRT基因突变的增加。 EF暴露导致的突变频率大约是假暴露导致的突变频率的两倍。我们的数据表明,由于细胞暴露于400 mT的可变磁场而引起的突变可能部分归因于EF。

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