Measurement of the optical functions of uniaxial materials by two-modulator generalized ellipsometry: rutile (TiO2)

Jellison GE; Modine FA; Boatner LA

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Measurement of the optical functions of uniaxial materials by two-modulator generalized ellipsometry: rutile (TiO2)

机译：用两调制器广义椭圆偏振光度法测量单轴材料的光学功能：金红石（TiO2）

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Two-modulator generalized ellipsometry is applied to determination of the optical functions of uniaxial rutile. For a nondepolarizing sample the two-modulator generalized ellipsometer determines all the elements of the normalized Jones matrix with one measurement and thereby totally characterizes light reflecting from the sample. If a uniaxial crystal is appropriately aligned, then determining its optical functions requires only a single measurement. We have used this new instrument to obtain optical functions of rutile that are the most accurate available for optical energies above the band edge. (C) 1997 Optical Society of America.

机译：二调制器广义椭圆偏振法用于确定单轴金红石的光学功能。对于非去极化样品，两调制器广义椭偏仪通过一次测量确定归一化琼斯矩阵的所有元素，从而完全表征从样品反射的光。如果单轴晶体被适当地对准，则确定其光学功能仅需要一次测量。我们已经使用这种新仪器获得了金红石的光学功能，该光学功能对于带边缘以上的光能而言是最准确的。（C）1997年美国眼镜学会。

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《Optics Letters》 |1997年第23期|共3页
作者
Jellison GE; Modine FA; Boatner LA;
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正文语种 eng
中图分类光学;
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ANISOTROPIC MEDIA;

机译：各向异性媒体;

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1. Measurement of the optical functions of uniaxial materials by two-modulator generalized ellipsometry: rutile (TiO2) [J] . Jellison GE, Modine FA, Boatner LA Optics Letters . 1997,第23期

机译：用两调制器广义椭圆偏振光度法测量单轴材料的光学功能：金红石（TiO2）
2. Optical functions of uniaxial ZnO determined by generalized ellipsometry [J] . Jellison GE., Boatner LA. Physical Review, B. Condensed Matter . 1998,第7期

机译：广义椭偏法测定单轴ZnO的光学功能
3. Temperature dependence of the optical functions of amorphous silicon-based materials: application to in situ temperature measurements by spectroscopic ellipsometry [J] . Daineka D, Suendo V, Cabarrocas PRI Thin Solid Films . 2004,第1a2期

机译：非晶硅基材料的光学功能与温度的关系：通过椭圆偏振光谱法在原位温度测量中的应用
4. Measurements of the optical functions of uniaxial crystals using two-modulator generalized ellipsometry (2-MGE) [C] . Gerald E. Jellison, Jr., Oak Ridge National Lab., Optical Diagnostic Methods for Inorganic Transmissive Materials . 1998

机译：使用二调制器广义椭偏仪（2-MGE）测量单轴晶体的光学功能
5. Generalized Ellipsometry on Complex Nanostructures and Low-Symmetry Materials [D] . Mock, Alyssa Lynn. 2017

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6. Optical Ellipsometry Measurements on the Diffraction Patterns from Single Fibers [O] . R. J. Baskin, K. Burton, J. S. Chen, 1986

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7. Upgrade and Operation of the Second Generation Two-Modulator Generalized Ellipsometry Microscope (2-MGEM2) [O] . Jellison Jr, Gerald Earle, Hunn, John D, Breninger, Andrew H. 2013

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Measurement of the optical functions of uniaxial materials by two-modulator generalized ellipsometry: rutile (TiO2)

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