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Structural and Optical Properties of Heterostructures with InAs Quantum Dots in an InGaAsN Quantum Well Grown by Molecular-Beam Epitaxy

机译:分子束外延生长的InGaAsN量子阱中具有InAs量子点的异质结构的结构和光学性质

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Results obtained in a study of the structural and optical properties of GaAs-based heterostructures with InAs quantum dot layers overgrown with InGaAsN quantum wells are presented. Transmission electron microscopy has been applied to analyze how the thickness of the InGaAsN layer and the content and distribution of nitrogen in this layer affect the size of nanoinclusions and the nature and density of structural defects. Itis shown that the size of InAs nanodomains and the magnitude of the lattice mismatch in structures containingnitrogen exceed those in nitrogen-free structures. A correlation between the luminescence wavelength and thesize and composition of nanodomains is demonstrated. Furthermore, a correlation between the emission intensity and defect density in the structure is revealed.
机译:提出的研究结果表明,在GaAs基异质结构的结构和光学性质研究中,InGaAsN量子阱覆盖了InAs量子点层。透射电子显微镜已用于分析InGaAsN层的厚度以及该层中氮的含量和分布如何影响纳米夹杂物的尺寸以及结构缺陷的性质和密度。结果表明,含氮结构中InAs纳米域的尺寸和晶格失配的大小超过了无氮结构中的InAs纳米结构域的大小。证明了发光波长与纳米域的大小和组成之间的相关性。此外,揭示了结构中的发射强度与缺陷密度之间的相关性。

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