首页> 外文期刊>Semiconductors >Raman Scattering in PbTe and PbSnTe Films: In Situ Phase Transformations
【24h】

Raman Scattering in PbTe and PbSnTe Films: In Situ Phase Transformations

机译:PbTe和PbSnTe薄膜中的拉曼散射:原位相变

获取原文
获取原文并翻译 | 示例
           

摘要

The PbTe and Pb_(1–x)Sn_xTe films, both undoped and doped with indium, are studied by Raman spectroscopy. It is found that the film surface changes during spectra recording. From comparative analysis of the data obtained in the study and those reported in publications, it is inferred that the 90, 117, and 138 cm~(–1) peaks correspond to the scattering of light at tellurium or tellurium-oxide precipitates. It is established that these peaks appear in the spectra of Pb_(1–x)Sn_xTe films and epitaxial PbTe films only when doped with indium. The 180-cm~(–1) peak is observed in the spectra of all of the samples and not attributed to the plasmon–phonon mode. The nature of the 180-cm~(–1) peak is still not completely understood.
机译:通过拉曼光谱研究了未掺杂和掺杂铟的PbTe和Pb_(1–x)Sn_xTe薄膜。发现在光谱记录期间膜表面改变。从研究中获得的数据和出版物中报告的数据进行对比分析,可以得出90、117和138 cm〜(-1)峰对应于碲或氧化碲沉淀物的光散射。可以确定这些峰仅在掺杂铟时才会出现在Pb_(1-x)Sn_xTe薄膜和外延PbTe薄膜的光谱中。在所有样品的光谱中都观察到了180 cm〜(–1)的峰,而不是由等离振子-声子模式引起的。 180-cm〜(–1)峰的性质仍不完全清楚。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号