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High-resolution electron microscopy observations of microplastic fracture in SiC under ball milling at room temperature

机译:室温球磨下SiC的塑性塑性断裂的高分辨率电子显微镜观察

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摘要

Nanometre-sized kinks and cracks formed in 6H SiC under ball milling (BM) at room temperature have been observed and characterized on the atomic scale using high-resolution electron microscopy (HREM). Observations of the kinks show that numerous positive and negative partials are aligned at either of the kink boundaries, and the stacking sequences in the kink band are considerably different from those in the other areas. It was also observed that the (0001) lattice planes in the kink band are kinked, indicating that microplasticity occurs in the normally brittle material SiC under BM even at room temperature. HREM observations of cracks show that cracks previously observed by transmision electron microscopy are not completely open but are at the initiation stage of fracture. Inside a crack, one residual kink region can be clearly observed, which indicates a correlation between kink and crack, that is a crack evolves from a kink.
机译:已经观察到在室温下球磨(BM)下在6H SiC中形成的纳米级扭结和裂纹,并使用高分辨率电子显微镜(HREM)在原子尺度上进行了表征。对扭结的观察表明,在任一扭结边界处,许多正和负部分对齐,并且扭结带中的堆积顺序与其他区域中的堆积顺序有很大不同。还观察到,扭结带中的(0001)晶面扭结,表明即使在室温下,在BM下通常脆性材料SiC也发生微塑性。 HREM对裂纹的观察表明,先前通过透射电子显微镜观察到的裂纹并未完全打开,而是处于断裂的起始阶段。在裂缝内部,可以清楚地观察到一个残留的扭结区域,这表明扭结和裂缝之间存在相关性,即裂缝是从扭结演变而来的。

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