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On the grain boundary and defect structure of nanocrystalline titanium oxide

机译:纳米晶二氧化钛的晶界和缺陷结构

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Transmission electron microscopy was used to study the crystal size distribution, grain-boundary disorder and defect structure in nanocrystalline titanium oxide prepared by reactive sputtering. The average grain diameter determined by measurements on dark-field micrographs was approximately 15 nm. Evidence of both ordered and disordered grain-boundary regions was found, and planar defects observed in grain interiors were identified as (011) deformation twins. Crystallographic shear defects that can occur as a result of aggregation of oxygen vacancies in understoichiometric titanium oxide were rarely present. Dislocations, with the exception of those necessary to accommodate misfit, were not seen. The limitations of high-resolution electron microscopy for investigation of grain-boundary structures in nanocrystalline materials are discussed.
机译:用透射电子显微镜研究了反应溅射法制备的纳米晶二氧化钛的晶体尺寸分布,晶界无序和缺陷结构。通过在暗场显微照片上测量确定的平均晶粒直径约为15 nm。发现有序和无序的晶界区域的证据,并且在晶粒内部观察到的平面缺陷被识别为(011)变形孪晶。在化学计量不足的二氧化钛中,由于氧空位聚集而可能发生的晶体剪切缺陷很少出现。除为适应失调所必需的脱臼外,未见脱臼。讨论了高分辨率电子显微镜在研究纳米晶材料中晶界结构方面的局限性。

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