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首页> 外文期刊>Physica status solidi, B. Basic research >Vapour growth of ZnSxSe1-x single crystals
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Vapour growth of ZnSxSe1-x single crystals

机译:ZnSxSe1-x单晶的气相生长

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摘要

Seeded chemical and physical vapour transport with H-2 and He, respectively, was used to grow twin-free ZnSxSe1-(x) (x < 0.15) single crystals with diameter of 50-55 mm and height up to 15 mm. Use of a source with polycrystalline ZnSSe having a composition gradient along the furnace axis, allowed to improve the homogeneity of alloy composition. The change of x per 1 cm along the growth direction in the grown crystals was as small as 1.5%. The etch pit density was (3-5) x 10(4) cm(-2). Specific resistance of ZnSSe wafers was decreased up to 0.06 Omega cm by annealing in liquid Zn:Al. [References: 11]
机译:分别使用H-2和He进行种子化学和物理气相传输,以生长直径为50-55 mm,高度最大为15 mm的无孪晶ZnSxSe1-(x)(x <0.15)单晶。使用具有沿炉轴的组成梯度的多晶ZnSSe的源可以改善合金组成的均匀性。在生长的晶体中,沿生长方向每1cm的x变化小至1.5%。蚀刻凹坑密度为(3-5)×10(4)cm(-2)。通过在液态Zn:Al中退火,ZnSSe晶片的比电阻降低至0.06 Omega cm。 [参考:11]

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