...
首页> 外文期刊>Physics world >Shot noise emerges as metal wires go to shorter lengths
【24h】

Shot noise emerges as metal wires go to shorter lengths

机译:金属线越短,散粒噪声就会出现

获取原文
获取原文并翻译 | 示例
           

摘要

SHOT noise, the time-dependent fluctuations in electrical current caused by the discreteness of the electron charge, is well known to occur in solid-state devices, such as tunnel junctions, Schottky barrier diodes and p-n junctions. Most textbooks on electronic devices will tell you that there is no shot noise in metallic resistors, just thermal noise and a frequency-dependent noise known as 1/f noise. However, our basic knowledge of electrical conduction in small devices has advanced to the stage where it is clear that this notion does not hold.
机译:众所周知,SHOT噪声是由电子电荷的不连续性引起的电流随时间变化的波动,众所周知,这种噪声会发生在固态器件中,例如隧道结,肖特基势垒二极管和p-n结。电子设备上的大多数教科书都会告诉您,金属电阻器中没有散粒噪声,只有热噪声和与频率有关的噪声,即1 / f噪声。但是,我们在小型设备中的电导基础知识已经发展到很明显这一概念不成立的阶段。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号