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Induced defects in ZnSe and ZnTe by electron and proton irradiation and defect-annealing behaviour

机译:电子和质子辐照在ZnSe和ZnTe中引起的缺陷以及缺陷退火行为

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In this study we discuss the microstructural changes after electron and proton irradiation and the thermal evolution of the radiation induced defects during isochronal annealing in ZnSe and ZnTe. The nominally undoped samples were irradiated either with 1 MeV or 2 MeV electrons or with 3 MeV protons. The investigation was performed with positron lifetime and Doppler-broadening measurements. [References: 15]
机译:在这项研究中,我们讨论了电子和质子辐照后的微观结构变化,以及在ZnSe和ZnTe等时退火过程中辐射诱发的缺陷的热演化。标称未掺杂的样品用1 MeV或2 MeV电子或3 MeV质子辐照。使用正电子寿命和多普勒扩展测量进行了研究。 [参考:15]

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