Application of genetic algorithms for characterization of thin layered materials by glancing incidence X-ray reflectometry

Dane AD.; de Boer DKG.; Leenaers AJG.; Buydens LMC.; Veldhuis A.

首页> 外文期刊>Physica, B. Condensed Matter >Application of genetic algorithms for characterization of thin layered materials by glancing incidence X-ray reflectometry

【24h】

Application of genetic algorithms for characterization of thin layered materials by glancing incidence X-ray reflectometry

机译：遗传算法在掠射X射线反射仪表征薄层材料中的应用

获取原文

获取原文并翻译 | 示例

掌桥外文数据库（机构版） >>

开具论文收录证明 >>

文献代查 >>

页面导航

摘要
著录项
相似文献
相关主题

摘要

A genetic algorithm for characterization of thin-layered materials by glancing incidence X-ray reflectometry is proposed. For both simulated and measured data good fits are obtained within a single run. This reduces the amount of human effort and expertise necessary for analyzing reflectivity measurements which makes genetic algorithms an attractive alternative to methods currently used. (C) 1998 Elsevier Science B.V. All rights reserved. [References: 19]

著录项

来源
《Physica, B. Condensed Matter》 |1998年第4期|共15页
作者
Dane AD.; de Boer DKG.; Leenaers AJG.; Buydens LMC.; Veldhuis A.;
展开▼
作者单位

展开▼
收录信息
原文格式 PDF
正文语种 eng
中图分类物理学;
关键词
Gixr; Genetic algorithms; Layered materials;

机译：Gixr;遗传算法;分层材料;

相似文献

外文文献
中文文献
专利

1. Application of genetic algorithms for characterization of thin layered materials by glancing incidence X-ray reflectometry [J] . Dane AD., de Boer DKG., Leenaers AJG., Physica, B. Condensed Matter . 1998,第3a4期

机译：遗传算法在掠射X射线反射仪表征薄层材料中的应用
2. Characterization of the morphology of titanium and titanium (Ⅳ) oxide nanolayers deposited on different substrates by application of grazing incidence X-ray diffraction and X-ray reflectometry techniques [J] . Stabrawa I, Kubala-Kukus A., Banas D., Thin Solid Films . 2019,第FEBa1期

机译：应用掠入射X射线衍射和X射线反射测量技术表征沉积在不同基底上的钛和钛（Ⅳ）纳米氧化物的形貌
3. Cross characterization of ultrathin interlayers in HfO2 high-k stacks by angle resolved x-ray photoelectron spectroscopy, medium energy ion scattering, and grazing incidence extreme ultraviolet reflectometry [J] . Banyay Matus, Juschkin Larissa, Bersch Eric, Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films . 2012,第4期

机译：通过角分辨X射线光电子能谱，中能离子散射和掠入射超紫外反射法对HfO2高k堆中超薄中间层进行交叉表征
4. Reference-free, Depth-dependent Characterization Of Nanoscaled Materials Using A Combined Grazing Incidence X-ray Fluorescence And X-ray Reflectometry Approach [C] . Philipp Honicke, Blanka Detlefs, Claudia Fleischmann, International Conference on Frontiers of Characterization and Metrology for Nanoelectronics . 2015

机译：使用组合的放牧入射X射线荧光和X射线反射测量方法的基准，无参考，深度依赖表征纳米级材料
5. Genetic algorithms and genetic programming for multiscale modeling: Applications in materials science and chemistry and advances in scalability [D] . Sastry, Kumara Narasimha 2007

机译：用于多尺度建模的遗传算法和遗传程序设计：在材料科学和化学中的应用以及可扩展性的发展
6. Synthesis and Characterization of Layered Double Hydroxides as Materials for Electrocatalytic Applications [O] . Domenica Tonelli, Isacco Gualandi, Elisa Musella, 2021

机译：层状双氢氧化物作为电催化应用材料的合成与表征
7. Band-gap depth profile of Cu(In1−x Ga x )Se2 absorbing layer in thin-film solar cell by glancing-incidence X-ray diffraction [O] . Yong-Il Kim, Ki-Bok Kim 2019

机译：Cu（In1-X Ga X）Se2通过渗透入射X射线衍射在薄膜太阳能电池中吸收层的带隙深度分布
8. Characterization of Thin Films and Layered Structures Using X-Ray Absorption and Reflection at Grazing Incidence [R] . Heald, S. M., Tranquada, J. M., Welch, D. O., 1984

机译：利用X射线吸收和反射在放牧发生率下表征薄膜和分层结构

Application of genetic algorithms for characterization of thin layered materials by glancing incidence X-ray reflectometry

摘要

著录项

相似文献

相关主题

期刊订阅