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首页> 外文期刊>Phytopathologia Mediterranea >Analysis by detached leaf assay of components of partial resistance of faba bean (Vicia faba L.) to chocolate spot caused by Botrytis fabae Sard.
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Analysis by detached leaf assay of components of partial resistance of faba bean (Vicia faba L.) to chocolate spot caused by Botrytis fabae Sard.

机译：通过离体叶片分析法分析了由Botrytis fabae Sard引起的蚕豆（Vicia faba L.）对巧克力斑点的部分抗性成分。

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摘要

Five faba bean (Vicia faba L.) genotypes with different levels of field susceptibility to chocolate spot caused by Botrytis fabae, were analysed for the components of partial resistance in a laboratory assay on living detached leaves. The incubationperiod (IP), the number of spots (NP), the lesion diameter (LD), the latency period (LP) and the number of spores/leaflet (NS), were determined and statistically analysed. Parameters LD, LP and NS were involved in characterising partial resistance, butIP did not appear to play a role. NS did not become a significant factor until 20 h after inoculation. Genotype FRY167 was most resistant with the lowest LD and NS values and the longest LP. In contrast, FRY30 had the highest level of susceptibility, with the highest LD and NS and the shortest LP. However, the resistant control BPL710 showed a slight deviation in that it expressed a long LP which was not significantly different from the values of the susceptible control Aguadulce. The absence of a correlation between LP and NS in BPL710 opens a discussion on the genetic control of its resistance.
机译：在实验室对活离体叶片的分析中，分析了五种蚕豆（蚕豆（Vicia faba L.））基因型，这些基因型具有不同水平的田间对灰霉病菌引起的巧克力斑点的敏感性。确定潜伏期（IP），斑点数（NP），病变直径（LD），潜伏期（LP）和孢子/小叶数目（NS），并进行统计分析。参数LD，LP和NS参与了部分电阻的表征，但是IP似乎没有发挥作用。直到接种后20小时，NS才成为重要因素。基因型FRY167最耐，LD和NS值最低，LP最长。相反，FRY30的敏感性最高，LD和NS最高，LP最短。但是，抗性对照BPL710表现出细微的差异，因为它表达的长LP与易感对照Aguadulce的值没有显着差异。 BPL710中LP和NS之间不存在相关性，这引发了对其抗性的遗传控制的讨论。

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