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首页> 外文期刊>Physica, C. Superconductivity and its applications >MICROSTRUCTURE AND PROPERTIES OF ARTIFICIAL GRAIN BOUNDARIES IN EPITAXIAL YBA2CU3O7-DELTA THIN FILMS GROWN ON [001] TILT Y-ZRO2 BICRYSTALS
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MICROSTRUCTURE AND PROPERTIES OF ARTIFICIAL GRAIN BOUNDARIES IN EPITAXIAL YBA2CU3O7-DELTA THIN FILMS GROWN ON [001] TILT Y-ZRO2 BICRYSTALS

机译：[001]倾斜的Y-ZRO2双晶硅上生长的YBA2CU3O7-δ型薄薄膜人工晶界的组织和性能

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摘要

The microstructure of artificial grain boundaries in YBa2Cu3O7-delta (YBCO) thin films grown on [001] tilt Y-ZrO2 (YSZ) bicrystal substrates has been characterized using transmission electron microscopy and atomic force microscopy. Despite a relatively straight morphology of the substrate boundaries, the film boundaries were wavy. The waviness was a result of the combined effects of grooving at the substrate boundaries prior to the film deposition and an island-growth mechanism for YBCO on YSZ substrates. The dihedral angle of the groove walls varied with the misorientation angle and depended on the symmetry of the substrate boundary. The amplitudes of the film boundary waviness compared well with the widths of the grooves. In addition, the grooves induced local bending of the YBCO lattice planes and additional tilt components perpendicular to the c-axis close to the film boundaries. [References: 29]
机译：使用透射电子显微镜和原子力显微镜对在[001]倾斜Y-ZrO2（YSZ）双晶衬底上生长的YBa2Cu3O7-δ（YBCO）薄膜中的人工晶界进行了微观结构表征。尽管衬底边界的形态相对较直，但膜边界却是波浪形的。波纹度是在膜沉积之前在基板边界处开槽的综合效果以及YSZ基板上YBCO的岛生长机制的综合结果。凹槽壁的二面角随取向差角而变化，并取决于基板边界的对称性。膜边界波纹的幅度与凹槽的宽度比较好。另外，凹槽引起YBCO晶格平面的局部弯曲以及垂直于c轴的靠近膜边界的附加倾斜分量。 [参考：29]

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