Critical current density and related microstructures of TFA-MOD YBCO coated conductors

Yamada Y.; Araki T.; Takahashi Y.; Yuasa T.; Kurosaki H. Hirabayashi I.; Iijima Y.; Takeda K.; Kim S.

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Critical current density and related microstructures of TFA-MOD YBCO coated conductors

机译：TFA-MOD YBCO涂层导体的临界电流密度和相关的微观结构

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Metalorganic deposition process using trifluoroacetate (TFA-MOD) processed YBCO film on LaAlO3 and IBAD (YSZ/Hastelloy) substrate exhibited high critical current density, J(c), at 77.3 K. The obtained J(c) values at 0 T were 7 and 1.7 MA/cm(2) for LaAlO3 and CeO2 buffered IBAD, respectively. High J(c) values over 10(5) A/cm(2) were maintained up to 4 T (B parallel toc-axis) for the LaAlO3 substrate and up to 3 T (B parallel toc-axis) for the CeO2 buffered IBAD substrate. These results imply that TFA-MOD with simple fabrication process is very promising for the practical YBCO coated conductor. (C) 2001 Elsevier Science B.V. All rights reserved. [References: 9]

机译：在LaAlO3和IBAD（YSZ / Hastelloy）基板上使用三氟乙酸盐（TFA-MOD）处理的YBCO膜的金属有机沉积工艺在77.3 K时显示出高临界电流密度J（c）。在0 T时获得的J（c）值为7 LaAlO3和CeO2缓冲的IBAD分别为1.7 MA / cm（2）。对于LaAlO3基板，最高J（c）值超过10（5）A / cm（2）保持高达4 T（平行于B轴），对于CeO2缓冲液，高达3 T（平行于B轴） IBAD基材。这些结果表明具有简单制造工艺的TFA-MOD对于实际的YBCO涂层导体是非常有前途的。（C）2001 Elsevier Science B.V.保留所有权利。 [参考：9]

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《Physica, C. Superconductivity and its applications》 |2001年第2期|共4页
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Yamada Y.; Araki T.; Takahashi Y.; Yuasa T.; Kurosaki H. Hirabayashi I.; Iijima Y.; Takeda K.; Kim S.;
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1. Critical current density and related microstructures of TFA-MOD YBCO coated conductors [J] . Yamada Y., Araki T., Takahashi Y., Physica, C. Superconductivity and its applications . 2001,第Pta2期

机译：TFA-MOD YBCO涂层导体的临界电流密度和相关的微观结构
2. Improvements in the Critical Current of YBCO-coated Conductors using an Advanced TFA-MOD Method [J] . Yuji Aoki, Ryo Teranishi, Yuji Aoki, 低温工学 . 2005,第2期

机译：使用先进的TFA-MOD方法改善YBCO涂层导体的临界电流
3. Advanced TFA-MOD process of high critical current YBCO films for coated conductors [J] . Yoshitaka Tokunaga, Tetsuji Honjo, Teruo Izumi Cryogenics . 2004,第11期

机译：用于涂层导体的高临界电流YBCO薄膜的先进TFA-MOD工艺
4. Phase and microstructure change of high critical current density TFA-MOD YBCO coated conductor [C] . Yutaka Yamada, Takeshi Araki, Haruhiko Kurosaki, Annual Meeting of the American Ceramic Society . 2003

机译：高临界电流密度TFA-MOD YBCO涂层导体的相位和微观结构变化
5. The critical current density of yttrium barium copper oxide coated conductors. [D] . Kim, Sang Il. 2007

机译：钇钡氧化铜涂层导体的临界电流密度。
6. The Effects of Grain Boundaries on the Current Transport Properties in YBCO-Coated Conductors [O] . Chao Yang, Yudong Xia, Yan Xue, 2015

机译：晶界对YBCO涂层导体中电流输运性能的影响
7. Influence of Gas Flow and Improvement of Homogeneity on the Distribution of Critical Current Density in YBCO Coated Conductor Processed by TFA-MOD Method [O] . Shiohara Kei, Higashikawa Kohei, Kawaguchi Teppei, 2012

机译：气流和均质性的提高对TFA-MOD法处理的YBCO涂层导体中临界电流密度分布的影响
8. High Current Density YBCO Coated Conductors On Strengthened Biaxially Textured Ni-W Substrates [R] . Paranthaman, M. 2001

机译：高强度电流密度YBCO涂层导体在增强的双轴织构Ni-W衬底上

Critical current density and related microstructures of TFA-MOD YBCO coated conductors

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