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首页> 外文期刊>Physica, C. Superconductivity and its applications >Influence of substrate irradiation on critical current density and microstructure in YBCO thin films
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Influence of substrate irradiation on critical current density and microstructure in YBCO thin films

机译:衬底辐照对YBCO薄膜临界电流密度和微观结构的影响

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摘要

Strontiumtitanate substrates have been irradiated in defined areas with a focused ion beam (FIB) of gallium ions. This leads to a change of the sur face structure of the substrates. Afterwards YBCO was grown epitactically on these substrates by pulsed laser deposition. The effect of the modification on the flux density distribution in the YBCO thin films has been observed magnetooptically and the local current distribution has been determined. The correlation between the change in j(c) and the microstructure of the YBCO samples, investigated by transmission electron microscopy (TEM), is discussed. [References: 3]
机译:钛酸锶基板已在镓离子的聚焦离子束(FIB)的指定区域进行了辐照。这导致基板的表面结构的改变。此后,通过脉冲激光沉积在这些衬底上外延生长YBCO。磁光法已经观察到改性对YBCO薄膜中的通量密度分布的影响,并且已经确定了局部电流分布。讨论了透射电子显微镜(TEM)研究的j(c)变化与YBCO样品微观结构之间的相关性。 [参考:3]

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