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Automated Testing and Fault Isolation of a Low Frequency Analog Circuit Card Assembly

机译：低频模拟电路卡组件的自动测试和故障隔离

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This thesis describes the automated testing and fault isolation which is performed on a Circuit Card Assembly (CCA) used in a complex naval weapons system. The automated testing is performed using a Hewlett Packard 9826 computer and IEEE-488 bus compatible equipment which comprise the Test Set known as the TE304. A complete circuit analysis of the CCA being tested is included in this thesis as well as program descriptions of the Acceptance Test Program and the Fault Isolation Program. Also included in this thesis is background information on the TE304 Automated Test Set, the equipment which make it up, and the software which is used to control it. This thesis was made possible through a U. S. Navy contract between the University of Louisville Electrical Engineering Department and the Naval Ordnance Station in Louisville. (Author)

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作者
Pilkenton, M. D.;
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年度 1986
页码 p.1-274
总页数 274
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Printed circuit boards; Faults; Acceptance tests; Circuit analysis; Naval equipment; Weapon systems; Weapons; Isolation; Test sets; Test methods; Assembly; Circuit boards; Computer programs; Analog systems; Low frequency;

机译：印刷电路板;故障;验收测试;电路分析;海军设备;武器系统;武器;隔离;测试装置;测试方法;装配;电路板;计算机程序;模拟系统;低频;

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专利

1. Automated Selection of Test Frequencies for Fault Diagnosis in Analog Electronic Circuits [J] . Cesare Alippi, Senior Member IEEE, Marcantonio Catelani IEEE Transactions on Instrumentation and Measurement . 2005,第3期

机译：自动选择测试频率以进行模拟电子电路故障诊断
2. On the application of symbolic techniques to the multiple faultlocation in low testability analog circuits [J] . Fedi G., Giomi R., Luchetta A., IEEE Transactions on Circuits and Systems. II, Express Briefs . 1998,第10期

机译：符号技术在低可测性模拟电路中的多重故障定位中的应用
3. On the application of symbolic techniques to the multiple fault location in low testability analog circuits [J] . Fedi G., Giomi R. IEEE Transactions on Circuits and Systems. II . 1998,第10期

机译：论符号技术在低可测性模拟电路中的多故障定位中的应用
4. Methods for the automated selection of test frequencies for fault diagnosis in analog electronic circuits: a comparison [C] . C. Alippi, M. Catelani, A. Fort, IEEE Instrumentation and Measurement Technology Conference . 2003

机译：模拟电子电路故障诊断的测试频率自动选择的方法：比较
5. Test generation for fault isolation in analog and mixed-mode circuits. [D] . Chakrabarti, Sudip. 2001

机译：在模拟和混合模式电路中测试故障隔离的生成。
6. Test Generation Algorithm for Fault Detection of Analog Circuits Based on Extreme Learning Machine [O] . Jingyu Zhou, Shulin Tian, Chenglin Yang, 2014

机译：基于极限学习机的模拟电路故障检测测试生成算法
7. Automated Selection of Test Frequencies for Fault Diagnosis in Analog Electronic Circuits [O] . Senior Member, Marcantonio Catelani, Ada Fort, 2014

机译：自动选择模拟电子电路故障诊断的测试频率

Automated Testing and Fault Isolation of a Low Frequency Analog Circuit Card Assembly

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