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DC Characteristics of InAs/AlSb HEMTs at Cryogenic Temperatures

机译:低温下Inas / alsb HEmT的直流特性

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摘要

The Direct Current (DC) properties of 110-nm gate-length InAs/AlSb- based high electron mobility transistors (HEMTs) at cryogenic (30K) and room temperature (300K) were investigated. Compared to 300K, devices at 30K exhibited lower on-resistance (R(sub ON)) and output conductance (g(sub DS)), a higher transconductance (g(sub m)), and a more distinct knee in the I (sub DS)(V(sub DS)) characteristics. The improvement in the DC performance at cryogenic temperature should mainly be attributed to the lower source-drain resistance.

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