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Selective Etching of Silicon for Selective Area Epitaxial Growth

机译:选择性蚀刻硅选择性区域外延生长

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Process conditions are described for selectively etching silicon by wet and dryetching techniques. High etch rates are achieved and a selectivity (etch rate of silicon/etch rate of masking material) as high as 600 is obtained when thermal oxide is used as a mask and SF6 as the gas in a reactive ion etcher at high pressure. Dry etch process parameters are optimized to produce undercut edge profiles and smooth silicon floors, both of which are necessary to accommodate the growth of epitaxial material in recesses. p4.

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