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Fabrication of high quality factor GaAs/InAsSb photonic crystal microcavities by inductively coupled plasma etching and fast wet etching

机译:通过电感耦合等离子体刻蚀和快速湿法刻蚀制备高品质因子GaAs / InAsSb光子晶体微腔

摘要

The authors demonstrate high quality factor GaAs-based L9 photonic crystal microcavities (PCMs) with embedded InAsSb quantum dots with emission in 1.3¿¿m at room temperature. The fabrication process uses reactive ion beam etching with a CHF3/N2 gas mixture and reactive ion etching with a BCl3/N2 gas mixture to form PCMs on air-suspended slabs. An optimum N2 partial flux content of 0.65 and a successful removal of deposits formed during the membrane release by a fast wet etching in HF provide optical quality factors (Q-factors) as high as ~30 000.
机译:作者展示了具有嵌入的InAsSb量子点的高质量因子基于GaAs的L9光子晶体微腔(PCM),在室温下的发射波长为1.3μm。该制造工艺使用CHF3 / N2气体混合物进行反应离子束刻蚀,以及BCl3 / N2气体混合物进行反应离子刻蚀,以在空气悬浮的平板上形成PCM。最佳的N2分通量含量为0.65,并且通过HF快速湿法蚀刻成功去除​​膜释放过程中形成的沉积物,可提供高达约30,000的光学质量因子(Q因子)。

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