首页> 外国专利> THIN FILM TRANSISTOR ARRAY SUBSTRATE FOR HIGH-RESOLUTION DIGITAL X-RAY DETECTOR AND HIGH-RESOLUTION DIGITAL X-RAY DETECTOR INCLUDING THE SAME

THIN FILM TRANSISTOR ARRAY SUBSTRATE FOR HIGH-RESOLUTION DIGITAL X-RAY DETECTOR AND HIGH-RESOLUTION DIGITAL X-RAY DETECTOR INCLUDING THE SAME

机译:用于高分辨率数字X射线检测器的薄膜晶体管阵列基质和包括其的高分辨率数字X射线检测器

摘要

Disclosed are a thin-film transistor array substrate for a high-resolution digital X-ray detector and a high-resolution digital X-ray detector including the same in which a photo-sensitivity is improved by increasing a fill factor, and interference between PIN diodes is minimized, and step coverage of the PIN diode is improved to improve stability of the PIN diode. To those ends, an area of the PIN diode is maximized, and a pixel electrode of the PIN diode is disposed inside the PIN layer. Further, a clad layer made of inorganic material is formed in an edge region and/or a contact hole region of the pixel electrode. Thus, a leakage current resulting from concentrating an electric field on a curved region may be minimized.
机译:公开了用于高分辨率数字X射线检测器的薄膜晶体管阵列基板以及包括该薄膜晶体管阵列基板的高分辨率数字X射线检测器,其中通过增加填充因子来提高光敏性以及PIN之间的干扰最小化了二极管,并且改善了PIN二极管的阶梯覆盖范围以改善PIN二极管的稳定性。为此,PIN二极管的面积被最大化,并且PIN二极管的像素电极被布置在PIN层内部。此外,在像素电极的边缘区域和/或接触孔区域中形成由无机材料制成的覆盖层。因此,可以使由于电场集中在弯曲区域上而引起的泄漏电流最小。

著录项

  • 公开/公告号US2020127154A1

    专利类型

  • 公开/公告日2020-04-23

    原文格式PDF

  • 申请/专利权人 LG DISPLAY CO. LTD.;

    申请/专利号US201916585520

  • 发明设计人 HANSEOK LEE;HYEJI JEON;

    申请日2019-09-27

  • 分类号H01L31/105;H01L31/08;H01L31/115;H01L31/0224;

  • 国家 US

  • 入库时间 2022-08-21 11:23:03

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