首页> 外国专利> METHOD OF MAKING SEMICONDUCTOR HETEROSTRUCTURES WITH ATOMICALLY SMOOTH InGaP AND InP STOP LAYERS ON GaAs AND InP SUBSTRATES

METHOD OF MAKING SEMICONDUCTOR HETEROSTRUCTURES WITH ATOMICALLY SMOOTH InGaP AND InP STOP LAYERS ON GaAs AND InP SUBSTRATES

机译:在GaAs和InP衬底上形成原子光滑的InGaP和InP阻挡层的半导体异质结构的方法

摘要

FIELD: electronic equipment.;SUBSTANCE: invention relates to electronic and optoelectronic engineering and can be used for production of monolithic integrated circuits operating in centimeter and millimeter ranges of wavelengths, as well as for production of vertical-emitting lasers of near infrared range. According to the invention there described is a method of making semiconductor heterostructures with atomically smooth InGaP and InP stop layers on GaAs and InP substrates and proposing structures of semiconductor heterostructures which provide formation of atomically smooth stop layers. Invention provides stable formation of atomically smooth phosphorus-containing InGaP and InP stop layers in layers of solid solutions consisting of indium and gallium arsenides, does not adversely affect parameters of manufactured devices. For stable formation of an atomically smooth stop layer of InGaP in heterostructures on GaAs substrates, a buffer layer of GaAs is grown, then successively an InGaP layer and a protective layer of GaP with thickness of 0.6–1.3 nm and only then a coating layer of arsenide is grown. For stable formation of atomically smooth stop layer InP in heterostructures on InP substrates, InGaAs buffer layer is grown, then layer InP and protective layer InGaP with thickness of 0.6–1.3 nm and only then coating layer of arsenide is grown.;EFFECT: formation of stop layers using described method provides formation of atomically smooth phosphorus-containing stop layers InGaP and InP in layers of solid solutions consisting of indium and gallium arsenides, and accurate control of etching depth over entire area of epitaxial plate when making devices of electronic and optoelectronic equipment.;3 cl, 2 dwg, 1 tbl
机译:技术领域本发明涉及电子和光电工程,并且可以用于生产在厘米和毫米范围的波长下工作的单片集成电路,以及用于生产近红外范围的垂直发射激光器。根据本发明,描述了一种在GaAs和InP衬底上制造具有原子上平滑的InGaP和InP停止层的半导体异质结构的方法,并提出了提供原子上平滑的停止层形成的半导体异质结构的方法。本发明在由铟和砷化镓组成的固溶体层中提供了原子上平滑的含磷InGaP和InP阻挡层的稳定形成,不会不利地影响所制造器件的参数。为了在GaAs衬底上的异质结构中稳定形成InGaP原子光滑的停止层,需要生长GaAs缓冲层,然后依次生长InGaP层和GaP保护层,其厚度为0.6-1.3nm,然后再覆盖砷化物生长。为了在InP衬底上稳定地形成异质结构中的原子平滑停止层InP,生长InGaAs缓冲层,然后生长厚度为0.6-1.3nm的InP层和保护层InGaP,然后才生长砷化物涂层。使用所述方法的停止层提供了在由铟和砷化镓组成的固溶体层中形成原子上光滑的含磷停止层InGaP和InP的作用,并且在制造电子和光电设备时精确控制了外延板整个区域的蚀刻深度。; 3厘升,2载重吨,1桶

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