首页> 外国专利> METHOD OF ANALYZING AND VISUALIZING THE CAUSE OF PROCESS FAILURE BY DERIVING THE DEFECT OCCURRENCE INDEX BY VARIABLE SECTIONS

METHOD OF ANALYZING AND VISUALIZING THE CAUSE OF PROCESS FAILURE BY DERIVING THE DEFECT OCCURRENCE INDEX BY VARIABLE SECTIONS

机译:用可变截面推导缺陷发生率指数分析和可视化过程失败原因的方法

摘要

A failure occurrence index for each variable section is derived, and a cause of the process failure is identified and visualized. The method includes the steps of obtaining first data including quality inspection result data measured by at least one sensor installed in each of a plurality of processes and second data including process data, A step of preprocessing individual data of each of the first data and the second data, generating analysis target data by integrating the preprocessed individual data, and analyzing the poor data based on univariate analysis Analyzing the cause according to individual variables, and deriving the failure cause index according to the analysis result based on the univariate analysis.
机译:导出每个可变部分的故障发生指标,并识别和显示过程故障的原因。该方法包括以下步骤:获得包括通过多个过程中的每一个中的至少一个传感器安装的质量检查结果数据的第一数据和包括过程数据的第二数据;预处理第一数据和第二数据中的每一个的单独数据的步骤。数据,通过整合预处理的单个数据生成分析目标数据,并基于单变量分析对不良数据进行分析,根据单个变量分析原因,并基于基于单变量分析的分析结果得出故障原因指标。

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