首页> 外国专利> POLISHING SOLUTION, METHOD FOR PRODUCING POLISHING SOLUTION, POLISHING SOLUTION STOCK SOLUTION, POLISHING SOLUTION STOCK SOLUTION CONTAINING BODY, AND CHEMICAL MECHANICAL POLISHING METHOD

POLISHING SOLUTION, METHOD FOR PRODUCING POLISHING SOLUTION, POLISHING SOLUTION STOCK SOLUTION, POLISHING SOLUTION STOCK SOLUTION CONTAINING BODY, AND CHEMICAL MECHANICAL POLISHING METHOD

机译:抛光液,生产抛光液的方法,抛光液库存溶液,包含身体的抛光液库存溶液以及化学机械抛光方法

摘要

One objective of the present invention is to provide a polishing solution which is not likely to cause dishing and defects on a polished surface when applied to CMP of an object to be polished, said object containing a cobalt-containing layer. Another objective of the present invention is to provide a method for producing a polishing solution, a polishing solution stock solution, a polishing solution stock solution containing body, and a chemical mechanical polishing method. A polishing solution according to the present invention is a polishing solution for chemical mechanical polishing, which contains a colloidal silica having a degree of association of 1-3, an organic acid, an azole compound and hydrogen peroxide. If this polishing solution is in contact with a cobalt substrate for 24 hours, a reaction layer that contains cobalt atoms and has a thickness of 0.5-20 nm is formed on the cobalt substrate.
机译:本发明的一个目的是提供一种抛光溶液,当将其施加到待抛光物体的CMP上时,该抛光溶液不太可能在抛光表面上引起凹陷和缺陷,所述物体包含含钴层。本发明的另一个目的是提供用于制造抛光液的方法,抛光液原液,抛光液原液容纳体以及化学机械抛光方法。根据本发明的抛光液是用于化学机械抛光的抛光液,其包含缔合度为1-3的胶体二氧化硅,有机酸,唑化合物和过氧化氢。如果该抛光液与钴基底接触24小时,则在钴基底上形成包含钴原子且厚度为0.5-20nm的反应层。

著录项

  • 公开/公告号WO2018159530A1

    专利类型

  • 公开/公告日2018-09-07

    原文格式PDF

  • 申请/专利权人 FUJIFILM CORPORATION;

    申请/专利号WO2018JP06964

  • 发明设计人 KAMIMURA TETSUYA;

    申请日2018-02-26

  • 分类号C09K3/14;B24B37;C09G1/02;H01L21/304;

  • 国家 WO

  • 入库时间 2022-08-21 12:42:49

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