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METHOD FOR DETERMINING A POSTURE OF A MULTILAYER CERAMIC CAPACITOR DEVICE FOR DETERMINING A POSTURE OF A MULTILAYER CERAMIC CAPACITOR METHOD FOR PRODUCING A SERIES OF MULTILAYER CERAMIC CAPACITORS AND A SERIES OF MULTILAYER CERAMIC CAPACITORS
METHOD FOR DETERMINING A POSTURE OF A MULTILAYER CERAMIC CAPACITOR DEVICE FOR DETERMINING A POSTURE OF A MULTILAYER CERAMIC CAPACITOR METHOD FOR PRODUCING A SERIES OF MULTILAYER CERAMIC CAPACITORS AND A SERIES OF MULTILAYER CERAMIC CAPACITORS
A method for determining a posture of a multi-layered ceramic capacitor comprises: a passing process of passing a multi-layered ceramic capacitor through a front of a magnetism generator (31) and a measuring instrument (32); a measurement process of measuring magnetic flux density when the multi-layered ceramic capacitor passes through the front of the measuring instrument (32); and a posture determination process of determining inequality of a determination object value, based on the magnetic flux density measured in the process of measuring the magnetic flux density, and at least one threshold value so as to determine a direction to which a first main surface and a second main surface face. In the posture determination process, when the determination object value is lower than a first threshold value, the second main surface is determined to face the measuring instrument (32).
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