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TEST PATTERN EXTRACTION DEVICE, TEST PATTERN EXTRACTION METHOD, TEST PATTERN EXTRACTION PROGRAM AND RECORDING MEDIUM STORING TEST PATTERN EXTRACTION PROGRAM
TEST PATTERN EXTRACTION DEVICE, TEST PATTERN EXTRACTION METHOD, TEST PATTERN EXTRACTION PROGRAM AND RECORDING MEDIUM STORING TEST PATTERN EXTRACTION PROGRAM
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机译:试验物提取装置,试验物提取方法,试验物提取程序和记录介质的试验物提取程序
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摘要
PROBLEM TO BE SOLVED: To provide a test pattern extraction device capable of preventing extraction of a defective pattern.;SOLUTION: A dead area definition information reading part 4 obtains dead area definition information related to a dead area being a period including a transition time of a signal and not to be used as an expectation value with regard to logic simulation result data (waveform data). Next, according to the dead area definition information, a dead area processing part 8 sets a dead area to the waveform data. Then according to the waveform data with the dead area set, a test pattern is extracted.;SELECTED DRAWING: Figure 1;COPYRIGHT: (C)2017,JPO&INPIT
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