首页> 外国专利> Beam profiler measuring intensity distribution of laser beam, laser oscillator, and laser processing device

Beam profiler measuring intensity distribution of laser beam, laser oscillator, and laser processing device

机译:光束轮廓仪,用于测量激光束,激光振荡器和激光加工装置的强度分​​布

摘要

A beam profiler which can determine whether or not a laser beam can be suitably output at a lower cost. The beam profiler is provided with a partial reflecting mirror, light receiving parts, and laser intensity sensors which are individually attached to the light receiving parts. The light receiving parts include a first light receiving part which receives a first region which includes an optical axis of the laser beam in a laser irradiation region of the laser beam and a second light receiving part which is insulated heat-wise from the first light receiving part and which receives a second region of a laser irradiation region which is different from the first region.
机译:可以确定是否可以以较低的成本适当地输出激光束的光束轮廓仪。光束轮廓仪设置有部分反射镜,光接收部分以及分别附接到光接收部分的激光强度传感器。受光部包括:第一受光部,其接收第一区域,该第一区域包括在激光束的激光照射区域中的激光束的光轴;以及第二受光部,其与第一受光部热绝缘该第一部分和第二部分接收激光照射区域的与第一区域不同的第二区域。

著录项

  • 公开/公告号US9304036B2

    专利类型

  • 公开/公告日2016-04-05

    原文格式PDF

  • 申请/专利权人 FANUC CORPORATION;

    申请/专利号US201514666501

  • 发明设计人 TAKASHI IZUMI;

    申请日2015-03-24

  • 分类号G01J1/42;G01J11/00;H01S3/13;

  • 国家 US

  • 入库时间 2022-08-21 14:28:16

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