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Focal length measuring device and a microlens array

机译:焦距测量装置和微透镜阵列

摘要

PROBLEM TO BE SOLVED: To provide a focal length measuring instrument and method of a microlens array, which is capable of measuring a focal length of a microlens array.;SOLUTION: A reticle pattern surface 31a of a reticle 31 is aligned with a focus position of a camera 20, and the camera 20 and the reticle 31 are fixed to each other by a holding tool 21. A mask 30 is irradiated with illuminating light from a transmissive illumination light source 22, and an image of a mask pattern 41 provided on a mask pattern surface 30a of the mask 30 is formed on the reticle pattern surface 31a by a microlens array 2. That is, the camera 20 and the reticle 31 are moved as one body to adjust the position of the reticle 31 so that images of the mask pattern 41 and a reticle pattern 40 are in-focus together on the reticle pattern surface 31a in the camera 20. A distance between the reticle pattern surface 31a and the mask pattern surface 30a is measured by laser displacement gauges 23 and 24 to obtain a focal length f of the microlens array 2.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供一种微透镜阵列的焦距测量仪器和方法,其能够测量微透镜阵列的焦距。解决方案:掩模版31的掩模版图案表面31a与焦点位置对准。照相机20和标线片31通过保持工具21彼此固定。照相机30和掩模版31通过来自透射照明光源22的照明光照射到掩模30,并且在掩模30上设置掩模图案41的图像。掩模30的掩模图案表面30a通过微透镜阵列2形成在掩模版图案表面31a上。即,照相机20和掩模版31作为一个整体移动以调节掩模版31的位置,从而使掩模版30的图像成像。掩模图案41和掩模版图案40一起聚焦在照相机20的掩模版图案表面31a上。掩模版图案表面31a和掩模图案表面30a之间的距离通过激光位移计23和24测量以获得。微透镜阵列2的焦距f ;;版权:(C)2013,JPO&INPIT

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