首页> 外国专利> SEMICONDUCTOR DEVICE WITH ONE-TIME PROGRAMMABLE MEMORY CELL INCLUDING ANTI-FUSE WITH MAETAL/POLYCIDE GATE

SEMICONDUCTOR DEVICE WITH ONE-TIME PROGRAMMABLE MEMORY CELL INCLUDING ANTI-FUSE WITH MAETAL/POLYCIDE GATE

机译:具有一次性可编程记忆体电池的半导体器件,其中包括与金属/聚丙烯酸酯门的反熔丝

摘要

A one-time programmable (OTP) memory cell includes two transistors including a dual gate transistor. The dual gate transistor is formed using the same processing operations used to form floating gate transistors in other areas of the semiconductor device. The dual gate transistor includes an upper gate isolated from a floating gate by a floating gate oxide, the combination of which produces an anti-fuse. The nonvolatile memory device may include a plurality of such OTP memory cells and one or more OTP memory cells are selected and programmed by applying a voltage sufficient to blow the anti-fuse by causing the floating gate oxide layer to break down and the upper gate to become shorted to the floating gate.
机译:一次性可编程(OTP)存储单元包括两个晶体管,该两个晶体管包括双栅极晶体管。使用与在半导体器件的其他区域中形成浮栅晶体管相同的处理操作来形成双栅晶体管。双栅晶体管包括通过浮栅氧化物与浮栅隔离的上栅,其组合产生反熔丝。非易失性存储器件可以包括多个这样的OTP存储单元,并且通过施加足以通过使浮置栅极氧化物层击穿并且使上栅极变为高电平来吹反熔丝的电压来选择和编程一个或多个OTP存储单元并对其进行编程。与浮动门短路。

著录项

  • 公开/公告号US2013301356A1

    专利类型

  • 公开/公告日2013-11-14

    原文格式PDF

  • 申请/专利权人 WAFERTECH LLC;

    申请/专利号US201313941120

  • 发明设计人 WEN-SZU CHUNG;SHU-LAN YING;RE-LONG CHIU;

    申请日2013-07-12

  • 分类号H01L29/788;G11C16/10;

  • 国家 US

  • 入库时间 2022-08-21 16:07:33

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